Wf/pc SV Observation Set #12: Wf/pc Calibration UV Flood Test

Details Wf/pc SV Observation Set #12: Wf/pc Calibration UV Flood Test Wf/pc SV Observation Set #12: Wf/pc Calibration UV Flood Test

Jul 1990

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1990hst..prop.1431w&link_type=abstract

HST Proposal ID #1431

Computer Science

Performance

Hst Proposal Id #1431

Scientific paper

To achieve stable quantum efficiency performance for the overthinned areas of the CCDs, the chips must be flooded with ultraviolet light. This will produce a uniform quantum efficiency response over the entire CCD. The quantum efficiency stability is chiefly dependent on temperature. The exact amount of charging required to eliminate quantum efficiency instability will be determined in ground tests. Revised 10/26/89 by PStanley to remove parallel S/C data line 40.00 from SEQ NO GAP special requirement.

Affiliated with

Also associated with

No associations

Rating

Wf/pc SV Observation Set #12: Wf/pc Calibration UV Flood Test does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Wf/pc SV Observation Set #12: Wf/pc Calibration UV Flood Test, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Wf/pc SV Observation Set #12: Wf/pc Calibration UV Flood Test will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFWR-SCP-O-1094023