Computer Science
Scientific paper
Sep 2003
adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2003esasp.540..217l&link_type=abstract
In: Proceedings of the 9th International Symposium on Materials in a Space Environment, 16-20 June 2003, Noordwijk, The Netherla
Computer Science
Space Environment, Materials, Contamination
Scientific paper
The effects of Vacuum UV radiation on the transmittance of optical windows contaminated by outgassing products of thermal control paints were studied. The effects of VUV were studied by a number of complementary techniques: in-situ techniques including Quartz Crystal Microbalance (QCM), Near UV-VIS spectrophotometer and X-ray Photoelectron Spectroscopy (XPS), and ex-situ techniques including Atomic Force Microscope (AFM), Scanning Electron Microscope (SEM), and Fourier Transform Infra-Red (FTIR) spectroscopy. Four different paints were used as contamination sources representing various types of chemical structures: silicones, polyurethanes and fluoropolymers. The contaminated samples were exposed to VUV radiation of up to 7000 Equivalent Sun Hours (ESH). Fluoropolymer based contamination showed high re-evaporation rate and could not be exposed to VUV radiation. The effect of VUV radiation on the transmittance of silicones and polyurethane based contamination layers was similar. At low doses the transmittance of irradiated samples increased compared to unexposed samples. Further irradiation caused a decrease in the optical transmittance. The mechanism responsible for the optical transmittance behavior is, however, different for each contamination type. Silicone type contamination reacts to VUV radiation by processes such as surface migration, crosslinking and oxide formation agglomerating in large solid brain-like textures. Polyurethane type contamination reaction to VUV radiation is through processes such as dewetting and polymerization, while remaining in a liquid form.
Gouzman Irina
Grossman Eitan
Levy Niv
Noter Yoram
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