Use of narrowband laser speckle for MTF characterization of CCDs

Details Use of narrowband laser speckle for MTF characterization of CCDs Use of narrowband laser speckle for MTF characterization of CCDs

Aug 1992

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1992spie.1683..144s&link_type=abstract

Proc. SPIE Vol. 1683, p. 144-151, Infrared Focal Plane Array Producibility and Related Materials, Raymond S. Balcerak; Paul W. P

Computer Science

Scientific paper

This paper presents a method for measuring the modulation transfer function (MTF) of a detector array from zero frequency to twice the Nyquist frequency. The equipment is simple and requires no complex optical components. Also, the use of laser speckle circumvents the problems inherent with traditional methods of MTF testing where the phase of the test target with respect to the sampling grid affects the observed contrast. The MTF measured with this method is compared to the MTF measured using sine targets. The results of the two methods agree to within 2%.

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