Ultra low noise photodetectors with internal discrete amplification

Details Ultra low noise photodetectors with internal discrete amplification Ultra low noise photodetectors with internal discrete amplification

Apr 2005

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2005spie.5726...43l&link_type=abstract

Semiconductor Photodetectors II. Edited by Cohen, Marshall J.; Dereniak, Eustace L. Proceedings of the SPIE, Volume 5726, pp

Computer Science

Performance

Scientific paper

We have designed and developed a new family of photodetectors with Internal Discrete Amplification (IDA) mechanism. These photodetectors can operate in linear (analog) detection mode with gain-bandwidth product up to 5.1014 and few-photon sensitivity as well as in the photon counting mode with count rates up to 108 cps. Some of their key performance characteristics exceed those of photomultiplier tube (PMT) and avalanche photodiode (APD) devices. The measured parameters of the detectors are gain > 105, excess noise factor as low as 1.02, maximum count rate > 108 counts/s, and rise/fall time < 300 ps.

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