Two-dimensional resistivity structure of the fault associated with the 2000 Western Tottori earthquake

Details Two-dimensional resistivity structure of the fault associated with the 2000 Western Tottori earthquake Two-dimensional resistivity structure of the fault associated with the 2000 Western Tottori earthquake

Dec 2007

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2007ep%26s...59.1211y&link_type=abstract

Earth, Planets and Space, Volume 59, p. 1211-1217.

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Two-dimensional resistivity surveys were carried out along two profiles that were laid across earthquake faults initiated by the 2000 Western Tottori earthquake. One profile was located 7~m from a trenching pit, thereby enabling a direct comparison of resistivity cross-section with the geological cross-section and, subsequently, a precise interpretation of the resistivity structure. Features of the resistivity cross-section were found to correspond fairly well to the geological cross-section. A clear resistivity boundary between the resistive and conductive zones matches the earthquake fault that was found by the trenching survey. Variations in resistivity depend primarily on the development of fractures. Two types of conductive zones were found: (1) a clear and deep-rooted conductor that corresponds to an earthquake fault and (2) an indistinct and spatially localized conductor that corresponds to a fracture attributed by landslides and collapse. A few weak conductive zones that match with discrete earthquake faults characterize our resistivity model. This feature is different from the resistivity cross-sections found at the Nojima and Ogura Faults that appeared at the time of the 1995 Hyogo-ken Nanbu earthquake; these two latter faults are characterized by distinct single conductive zones. Based on geomorphological, geological, and seismological evidence, the earthquake fault of the 2000 Western Tottori earthquake can be classified as an immature fault. In contrast, the Nojima and Ogura Faults have been active for at least the entire Quaternary period. We conclude that the difference in the fault development stages is reflected in their different resistivity structures.

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