Transient x-ray diffraction used to diagnose shock compressed Si crystals on the Nova laser

Details Transient x-ray diffraction used to diagnose shock compressed Si crystals on the Nova laser Transient x-ray diffraction used to diagnose shock compressed Si crystals on the Nova laser

Jan 1999

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1999rsci...70..629k&link_type=abstract

Review of Scientific Instruments, Volume 70, Issue 1, pp. 629-632 (1999).

Computer Science

10

X-Ray Diffraction, Structure Of Clean Surfaces, Elemental Solids, Methods Of Materials Testing And Analysis

Scientific paper

Transient x-ray diffraction is used to record time-resolved information about the shock compression of materials. This technique has been applied on Nova shock experiments driven using a hohlraum x-ray drive. Data were recorded from the shock release at the free surface of a Si crystal, as well as from Si at an embedded ablator/Si interface. Modeling has been done to simulate the diffraction data incorporating the strained crystal rocking curves and Bragg diffraction efficiencies. Examples of the data and post-processed simulations are presented.

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