Toward nanometer accuracy laser metrology for phase-referenced interferometry with the VLTI

Details Toward nanometer accuracy laser metrology for phase-referenced interferometry with the VLTI Toward nanometer accuracy laser metrology for phase-referenced interferometry with the VLTI

Feb 2003

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2003spie.4838..983l&link_type=abstract

Interferometry for Optical Astronomy II. Edited by Wesley A. Traub . Proceedings of the SPIE, Volume 4838, pp. 983-994 (2003).

Astronomy and Astrophysics

Astronomy

2

Scientific paper

The PRIMA laser metrology system is being developed to monitor optical path differences and optical path fluctuations encountered by two stellar objects inside the VLTI during phased-referenced observations. This system, which will operate at the scale of the VLTI, has an accuracy goal of a few nanometers. After an introduction to its design, based on heterodyne interferometry, this paper presents the results of sub-system characterization and prototyping as well as experimental results obtained during full-scale testing at the Paranal Observatory.

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