Total dose and single event effects irradiation of various commercial integrated circuits in logic families and line interfaces

Details Total dose and single event effects irradiation of various commercial integrated circuits in logic families and line interfaces Total dose and single event effects irradiation of various commercial integrated circuits in logic families and line interfaces

Dec 2002

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2002esasp.507..387m&link_type=abstract

Proceedings of the European Space Components Conference, ESCCON 2002, 24-27 September 2002, Toulouse, France. Compiled by R.A. H

Mathematics

Logic

Scientific paper

This paper presents heavy ion single event effect as well as total
ionising dose test results for candidate spacecraft electronics.
Microelectronics selected and tested include Logic families and Line
Interfaces.

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