Three approaches in infrared imaging of electronic devices

Details Three approaches in infrared imaging of electronic devices Three approaches in infrared imaging of electronic devices

Sep 2003

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2003spie.5092...83m&link_type=abstract

Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VIII. Edited by Murrer, Robert Lee, Jr. Proceedings of

Computer Science

Performance

2

Scientific paper

We present further progress in high-resolution time-resolved thermal imaging of electronic and optoelectronic devices. We show that concurrent multi-spectral mapping of light, emissivity, and heat patterns a single device produces may hold the key of the device performance improvement by visualizing current carrier distribution and heat flows. To demonstrate advantage of this approach, thermal heaters, light emitting devices, and Peltier coolers are tested with emphasis laid on uniformity of carrier distribution and thermal control.

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