The Wide-Field Imaging Interferometry Testbed III. Metrology Subsystem

Details The Wide-Field Imaging Interferometry Testbed III. Metrology Subsystem The Wide-Field Imaging Interferometry Testbed III. Metrology Subsystem

2002-10-01

arxiv.org/abs/astro-ph/0210043v1

Astronomy and Astrophysics

Astrophysics

12 pages, 12 figures. To be published in Proc. SPIE Conf. 4852 "Interferometry in Space," ed. M. Shao

Scientific paper

10.1117/12.460948

In order for data products from WIIT to be as robust as possible, the alignment and mechanical positions of source, receiver, and detector components must be controlled and measured with extreme precision and accuracy, and the ambient environment must be monitored to allow environmental effects to be correlated with even small perturbations to fringe data. Relevant detailed anatomy of many testbed components and assemblies are described. The system of displacement measuring interferometers (DMI), optical encoders, optical alignment tools, optical power monitors, and temperature sensors implemented for control and monitoring of the testbed is presented.

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