Statistics – Applications
Scientific paper
Nov 1987
adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1987ukae.reptr....s&link_type=abstract
Final Report United Kingdom Atomic Energy Authority, Harwell (England). Radiation Effects and Applications Centre.
Statistics
Applications
Cosmic Rays, Ion Beams, Single Event Upsets, Space Environment Simulation, Calibrating, Dosimeters, Radiation Tolerance, Spacecraft Components, Transputers, Very Large Scale Integration
Scientific paper
The design, commissioning, and use of a dedicated beam line for single event testing are described. Correlation of the results with those obtained elsewhere indicates the suitability of the ion beams available and the accuracy of the beam dosimetry. The facility was used to examine the single event upset sensitivity of 64K static RAMs and the Inmos T414 Transputer. Results show that the dosimetry system provides reliable information and that the facility can be used for characterizing the cosmic ray sensitivity of VLSI devices with confidence. Ion beams can be steered and focused in the new beam line with particular ease. These characteristics are beneficial in the setting up of beams and in maintaining a steady flux.
Farren J.
Mapper D.
Sanderson T. K.
Stephen J. H.
No associations
LandOfFree
The Single Event Upset (SEU) test facility on the Hardwell tandem generator for cosmic ray simulation does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.
If you have personal experience with The Single Event Upset (SEU) test facility on the Hardwell tandem generator for cosmic ray simulation, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and The Single Event Upset (SEU) test facility on the Hardwell tandem generator for cosmic ray simulation will most certainly appreciate the feedback.
Profile ID: LFWR-SCP-O-1716251