The Accidental Detection Index as a Fault Ordering Heuristic for Full-Scan Circuits

Details The Accidental Detection Index as a Fault Ordering Heuristic for Full-Scan Circuits The Accidental Detection Index as a Fault Ordering Heuristic for Full-Scan Circuits

2007-10-25

arxiv.org/abs/0710.4637v1

Dans Design, Automation and Test in Europe - DATE'05, Munich : Allemagne (2005)

Computer Science

Other Computer Science

Submitted on behalf of EDAA (http://www.edaa.com/)

Scientific paper

We investigate a new fault ordering heuristic for test generation in full-scan circuits. The heuristic is referred to as the accidental detection index. It associates a value ADI (f) with every circuit fault f. The heuristic estimates the number of faults that will be detected by a test generated for f. Fault ordering is done such that a fault with a higher accidental detection index appears earlier in the ordered fault set and targeted earlier during test generation. This order is effective for generating compact test sets, and for obtaining a test set with a steep fault coverage curve. Such a test set has several applications. We present experimental results to demonstrate the effectiveness of the heuristic.

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