Test system design used to characterize and test the MOSAD technology multiplexed oversampled A/D all-digital FPA

Details Test system design used to characterize and test the MOSAD technology multiplexed oversampled A/D all-digital FPA Test system design used to characterize and test the MOSAD technology multiplexed oversampled A/D all-digital FPA

Jul 1998

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1998spie.3379..483b&link_type=abstract

Proc. SPIE Vol. 3379, p. 483-491, Infrared Detectors and Focal Plane Arrays V, Eustace L. Dereniak; Robert E. Sampson; Eds.

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The MOSAD, Multiplexed Oversampled Analog to Digital conversion approach at Amain Electronics research center, introduces an extremely low power on focal plane analog to digital conversion at each pixel site. The MOSAD technology has been tested and characterized for different focal plane array sizes. This approach has demonstrated superior linearity, well capacity and signal to noise ratio, which exceeds existing A/D capabilities, by eliminating all analog multiplexing and readout electronics off focal plane. This document describes the design, characterization and testing methodology to satisfy the variety of requirements for the readout interface to the MOSAD technology. The necessary readout interface electronics used to validate the MOSAD technology with Dewar assembly is presented. Results from the testing performance considerations such as signal to noise ratio are discussed. Amain Electronics test methodology considerations are described to show that an all digital focal plane array simplifies the future FPA test complexity and methodology.

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