Test of STIS End of Slit Pseudo-Aperture Locations

Details Test of STIS End of Slit Pseudo-Aperture Locations Test of STIS End of Slit Pseudo-Aperture Locations

Jul 2000

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2000hst..prop.8891k&link_type=abstract

HST Proposal ID #8891

Computer Science

Hst Proposal Id #8891

Scientific paper

Decreasing charge transfer efficiency in the STIS CCD has a detrimental effect on faint spectra acquired at the default location at the center of the chip. For signal levels of 50-100 e-, 10-15% of the charge can be lost during readout. For spectra of point sources and compact objects such as galactic nuclei, the full length of the slit is not needed. A target location closer to the read-out amplifier near the end of the slit can decrease the charge lost during parallel transfers by a factor of ~5. This proposal will test the implementation of new pseudo-apertures defined at row 900 on the CCD from the proposal-processing ground-system segment through the data calibration pipeline.

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