Test Collections for Patent-to-Patent Retrieval and Patent Map Generation in NTCIR-4 Workshop

Details Test Collections for Patent-to-Patent Retrieval and Patent Map Generation in NTCIR-4 Workshop Test Collections for Patent-to-Patent Retrieval and Patent Map Generation in NTCIR-4 Workshop

2004-04-10

arxiv.org/abs/cs/0404025v1

Proceedings of the 4th International Conference on Language Resources and Evaluation (LREC-2004), pp.1643-1646, May. 2004.

Computer Science

Computation and Language

4 pages, Proceedings of the 4th International Conference on Language Resources and Evaluation (to appear)

Scientific paper

This paper describes the Patent Retrieval Task in the Fourth NTCIR Workshop, and the test collections produced in this task. We perform the invalidity search task, in which each participant group searches a patent collection for the patents that can invalidate the demand in an existing claim. We also perform the automatic patent map generation task, in which the patents associated with a specific topic are organized in a multi-dimensional matrix.

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