Temperature Dependence of the Structure of Liquid Indium

Mathematics – Probability

Scientific paper

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Scientific paper

The x-ray diffraction pattern of liquid indium were measured at 170, 280, 390, 500, and 650°C. For comparison, liquid mercury was measured at room temperature. All data were taken with a θ-θ diffractometer from the open surface of the melt between values of K=4πθλ=1.5 and 15 Å-1. Absolute intensity data Ie.u.coh were obtained by scaling the measured intensity of In to that of liquid mercury (coh=coherent, e.u. =electron units). The values of Ie.u.coh for K>12 did not show extensive modulation and were in good agreement with the square of the dispersion-corrected scattering factor f of In. The interference function I(K) was calculated by dividing the Ie.u.coh values by the theoretical f2 values. Fourier transform of I(K) yielded the radial distribution function RDF=4πr2ρ(r) and pair probability function g(r)=ρ(r)ρ0, where ρ0 is the atomic density. The RDF curve of Hg is completely free of ripples below r

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