Systematic errors in high-precision optical interferometric astrometry

Details Systematic errors in high-precision optical interferometric astrometry Systematic errors in high-precision optical interferometric astrometry

Jun 1995

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1995spie.2477..188n&link_type=abstract

Proc. SPIE Vol. 2477, p. 188-208, Spaceborne Interferometry II, Robert D. Reasenberg; Ed.

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This paper lists several of the systematic error sources which we have identified in our studies of POINTS, concentrating on those which are expected to affect other spaceborne astrometric interferometers as well. Many of them also are expected to affect ground-based optical interferometers. Among the errors is a newly discovered systematic contribution which only occurs in the simultaneous presence of diffraction, aberration, spectrometer dispersion, and two-beam (Michelson) interference. This error can be as large as several nanometers of optical path difference, and thus may constitute an important source of systematic uncertainty in ground-based astrometric measurements as well.

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