System response function - A new approach to minimize IR testing errors

Details System response function - A new approach to minimize IR testing errors System response function - A new approach to minimize IR testing errors

Oct 1990

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1990spie.1309..258m&link_type=abstract

IN: Infrared imaging systems: Design, analysis, modeling, and testing; Proceedings of the Meeting, Orlando, FL, Apr. 16-18, 1990

Computer Science

Performance

Error Analysis, Image Contrast, Infrared Imagery, Performance Tests, Thermal Noise, Infrared Instruments, Noise Spectra, Test Equipment

Scientific paper

Thermal Imaging Systems are characterized by various tests such as Minimum Resolvable Temperature (MRT), System Intensity Transfer Function (SITF) and Noise Equivalent Temperature Differential (NETD). Numerous sources of errors can effect these test giving misleading results. These error sources are analyzed and a new correction methodology is presented.

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