Synchrotron radiation X ray topography study of lateral field resonators

Details Synchrotron radiation X ray topography study of lateral field resonators Synchrotron radiation X ray topography study of lateral field resonators

Jun 1992

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1992esasp.340..105c&link_type=abstract

In ESA, Frequency and Time Forum p 105-109 (SEE N93-24978 09-70)

Statistics

Applications

Harmonics, Resonators, Synchrotron Radiation, Topography, X Ray Diffraction, Coupled Modes, Excitation, Laue Method, Synchrotrons

Scientific paper

Using synchrotron radiation, plano-convex AT resonators excited by a lateral field were studied by the X-ray topography technique. Different overtones and anharmonics of the three types of the thickness modes were observed. The study showed that it is possible to excite more modes with the lateral field excitation than with the thickness field excitation. These modes can present intrinsic interest due to the values of the temperature coefficient and/or of the coupling coefficient. The new degree of freedom, given by the possibility of choosing the direction of the excitation field, permits interesting applications such as the suppression or excitation of one type of mode. This study can help to understand the coupled modes which appear in the thickness excitation resonators.

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