Synchrotron powered FT-IR microspectroscopy enhances spatial resolution for probing and mapping of plant materials

Details Synchrotron powered FT-IR microspectroscopy enhances spatial resolution for probing and mapping of plant materials Synchrotron powered FT-IR microspectroscopy enhances spatial resolution for probing and mapping of plant materials

Jun 1998

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1998aipc..430..354w&link_type=abstract

The eleventh international conference on fourier transform spectroscopy. AIP Conference Proceedings, Volume 430, pp. 354-357 (1

Other

Ionizing Radiations, Spectra, Photodissociation, And Photoionization, Luminescence

Scientific paper

Cross sections of grain kernels, leaves, other plant material, and their products have been examined routinely in our own laboratory with an integrated FT-IR microspectrometer equipped with a conventional (thermal) globar source. With plant material, scattering is often a problem. Representative (low density) mapping requires interpolation between spots on the tissue actually interrogated. High density (100%) mapping with a small pixel size is typically painstakingly done and requires coaddition of many scans. With the synchrotron source (National Synchrotron Light Source, Beamline U2B) of the U.S. Department of Energy's Brookhaven National Laboratory, Upton, New York, nearly all of these problems are solved. Low thermal noise and brightness of the beam provide high S/N. The non-divergence of the synchrotron microbeam allows the high S/N to be retained even with aperturing of 6 μm or 12 μm sizes. Diffraction influences the practical limit. Step sizes corresponding to the small aperture dimension reveal highly localized chemical differences between adjacent pixels of a tissue specimen.

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