Synchrotron measurements of the absolute x-ray quantum efficiency of CsI-coated microchannel plates

Details Synchrotron measurements of the absolute x-ray quantum efficiency of CsI-coated microchannel plates Synchrotron measurements of the absolute x-ray quantum efficiency of CsI-coated microchannel plates

Nov 1998

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1998spie.3445..384r&link_type=abstract

Proc. SPIE Vol. 3445, p. 384-392, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy IX, Oswald H. Siegmund; Mark A. Gummin

Astronomy and Astrophysics

Astronomy

1

Scientific paper

Two identical CsI-coated, low noise microchannel plate (MCP) detectors were taken to the Daresbury Synchrotron Radiation Source (SRS) to measure their quantum efficiencies over two different energy ranges - 450 eV to 1200 eV and 4.5 eV to 9.5 eV. The SRS was run in low ring current with the beam flux monitored using single wire gas proportional counters. We present accurate measurements of edge-related absolute quantum efficiency features due to the CsI photocathodes. This data will be incorporated into the calibration program of the Advanced X-ray Astrophysical Facility High Resolution Camera.

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