Surface analysis of polished fused-silica laser lenses by ion-scattering spectrometry

Details Surface analysis of polished fused-silica laser lenses by ion-scattering spectrometry Surface analysis of polished fused-silica laser lenses by ion-scattering spectrometry

Oct 1982

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1982stin...8322588o&link_type=abstract

Surface analysis of polished fused-silica laser lenses by ion-scattering spectrometry California Univ., Lawrence Livermore Lab.

Computer Science

Beam Neutralization, Ion Scattering, Neodymium Lasers, Nova Laser System, Spectroscopy, Sputtering, Surface Defects, Cerium Oxides, Cleaning, Correlation, Impurities, Ion Beams, Iron Oxides, Laser Damage, Lenses

Scientific paper

New advances in high powered glass lasers, particularly the NOVA system, have resulted in a need for lenses having higher damage threshold values than those now available. It is currently thought that surface contaminants on the lenses are responsible for initiating part of the damage. These contaminants are apparently introduced during the final polishing stages. Ion scattering spectrometer (ISS) was used to identify contaminants arising through the use of different polishing techniques. Five lenses were studied, each having undergone different polishing procedures. The first lens was not polished after receiving it from the manufacturer. Ion microprobe data were available for this lens, and they were compared to ISS results. The second lens was polished with rouge. The third lens was studied as received from the manufacturer. The final two lenses had both been polished using high-purity ceria, cerium oxide.

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