Computer Science
Scientific paper
Sep 1985
adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1985hwi..reptr....t&link_type=abstract
Quarterly Technical Report, 1 Jul. - 30 Sep. 1985 Honeywell, Inc., Minneapolis, MN. (Systems and Research Center.)
Computer Science
Automatic Control, Circuits, Crystal Lattices, Deposition, Mercury Cadmium Tellurides, Mercury Tellurides, Molecular Beam Epitaxy, Optical Bistability, Optical Paths, Optical Thickness, Precision, Sampling, Substrates
Scientific paper
The automation of Molecular Beam Epitaxy (MBE) system shutters was completed for the substrate and the Mercury, Cadmium Telluride and Telluride sources. As reported earlier, the automated shutter operations allow for much more precise thickness control of the superlattice layers during the deposition. Also, from signal-to-noise considerations, performing the nonlinear optical experiments requires the use of thick (>2 micrometer) superlattice samples which involve several hundred layers of Mercury Telluride and Cadmium Telluride. This can best be accomplished by using an automated Molecular Beam Epitaxy system. The current superlattice design calls for alternate layers of HgTe and CdTe with thicknesses of 100-150 A. A p-type sample with this structure is expected to yield a third order susceptibility (x(3)) of 100 times larger than that of the bulk HgCdTe. A number of test runs were carried out with the automated MBE system. These runs resulted in five superlattice samples of various thicknesses. One sample is now being used in a preliminary experiment of optical phase conjugation to establish baseline data.
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