Subnanometer level model validation of the SIM interferometer

Details Subnanometer level model validation of the SIM interferometer Subnanometer level model validation of the SIM interferometer

Oct 2004

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2004spie.5491..361k&link_type=abstract

New Frontiers in Stellar Interferometry, Proceedings of SPIE Volume 5491. Edited by Wesley A. Traub. Bellingham, WA: The Intern

Computer Science

Performance

Scientific paper

The Space Interferometer Mission (SIM) flight instrument will not undergo a full performance, end-to-end system test on the ground due to a number of constraints. Thus, analysis and physics-based models will play a significant role in providing confidence that SIM will meet its science goals on orbit. The various models themselves are validated against the experimental results of severl "picometer" testbeds. In this paper we describe a set of models that are used to predict the magnitude and functional form of a class of field-dependent systematic errors for the science and guide interferometers. This set of models is validated by comparing predictions with the experimental results obtained from the MicroArcsecond Metrology (MAM) testbed and the Diffraction testbed (DTB). The metric for validation is provided by the SIM astrometric error budget.

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