Sub-arcsecond, differential deflectometry to measure thermally induced distortions of the Swift optical bench

Details Sub-arcsecond, differential deflectometry to measure thermally induced distortions of the Swift optical bench Sub-arcsecond, differential deflectometry to measure thermally induced distortions of the Swift optical bench

Mar 2003

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2003spie.4851..587l&link_type=abstract

X-Ray and Gamma-Ray Telescopes and Instruments for Astronomy. Edited by Joachim E. Truemper, Harvey D. Tananbaum. Proceedings

Astronomy and Astrophysics

Astronomy

Scientific paper

The Swift optical bench is a roughly 2.7 m diameter, 0.1 m thick composite structure carrying the Burst Alert Telescope (BAT), X-ray Telescope (XRT), and the Ultraviolet Optical Telescope (UVOT) as well as various attitude control instrumentation for the spacecraft. A high precision test of the optical bench using multi-aperture optical deflectometry was developed to verify that the relative boresights of the XRT and UVOT instruments would not change by more than several arcseconds when a worst case on-orbit temperature gradient is imposed through the thickness of the bench. Results of validation tests in a laminar flow cleanroom environment without vibration isolation demonstrated a differential measurement capability with 0.2 arcsecond sensitivity and 0.5 arcsecond accuracy per day. The technique is easily adaptable to similar deflection monitoring requirements for other large spacecraft structures.

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