Study of the polarization dependence of the photoelectric effect in the soft X-ray band - A focal plane photoelectric stellar X-ray polarimeter for the Spectrum-X-Gamma mission

Details Study of the polarization dependence of the photoelectric effect in the soft X-ray band - A focal plane photoelectric stellar X-ray polarimeter for the Spectrum-X-Gamma mission Study of the polarization dependence of the photoelectric effect in the soft X-ray band - A focal plane photoelectric stellar X-ray polarimeter for the Spectrum-X-Gamma mission

Jul 1989

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1989spie.1160..580h&link_type=abstract

IN: X-ray/EUV optics for astronomy and microscopy; Proceedings of the Meeting, San Diego, CA, Aug. 7-11, 1989 (A90-46006 21-74).

Astronomy and Astrophysics

Astrophysics

1

Photoelectric Effect, Polarimeters, Polarization (Waves), Space Missions, X Ray Spectra, Bragg Angle, Cesium Iodides, Grazing Incidence, Photocathodes, Photoelectrons, X Ray Astrophysics Facility

Scientific paper

An experimental study of the polarization dependence of the photoelectric effect in cesium iodide in the soft X-ray band was started (Heckler et al., 1989). At a grazing angle of 10 degrees and a photon energy of 2.6 keV, it is found that the photoelectric yield from a thin layer of evaporated cesium iodide varies by 12.4 percent as the polarization vector of the incident X-ray beam is rotated about the line-of-sight. The rotation angle corresponding to the maximum photoyield is displaced by 16 degrees from the normal to the photocathode. This modulation and phase shift are in good agreement with the results recently reported by Fraser, et al. (1989) It is shown that a focal plane stellar X-ray polarimeter based on this photoelectric effect will be substantially more efficient than convential X-ray polarimeters such as those based on either Bragg reflection or scattering from low atomic number targets.

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