Structural and magnetic properites of Xe ion irradiated Co/Si bilayers

Details Structural and magnetic properites of Xe ion irradiated Co/Si bilayers Structural and magnetic properites of Xe ion irradiated Co/Si bilayers

Jul 2008

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2008pobeo..84..193n&link_type=abstract

Publications of the Astronomical Observatory of Belgrade, vol. 84, pp. 193-196

Astronomy and Astrophysics

Astronomy

Scientific paper

Polycrystalline cobalt layers, deposited on Si(110) wafers via electron beam evaporation to a thickness of 55 nm, were irradiated at room temperature with 200 keV Xe ions to fluences of up to 15 x10^15 ions/cm^2.The atomic and magnetic force microscopy (AFM and MFM) were used to investigate the changes in the roughness and magnetic properties of the Co/Si bilayers. Ion beam induced structural changes were correlated with magnetic properties.

Affiliated with

Also associated with

No associations

Rating

Structural and magnetic properites of Xe ion irradiated Co/Si bilayers does not yet have a rating. At this time, there are no reviews or comments for this scientific paper.

If you have personal experience with Structural and magnetic properites of Xe ion irradiated Co/Si bilayers, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Structural and magnetic properites of Xe ion irradiated Co/Si bilayers will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFWR-SCP-O-788049