Statistics – Applications
Scientific paper
Jul 1998
adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1998spie.3446...49h&link_type=abstract
Proc. SPIE Vol. 3446, p. 49-54, Hard X-Ray and Gamma-Ray Detector Physics and Applications, F. Patrick Doty; Richard B. Hoover;
Statistics
Applications
1
Scientific paper
The structure and chemistry of grain boundaries in commercial Cd(subscript 1-x)Zn(subscript x)Te, prepared by the high- pressure Bridgman technique, have been analyzed using transmission electron microscopy, scanning electron microscopy, infrared-light microscopy and visible-light microscopy. These analyses show that the grain boundaries inside the Cd(subscript 1-x)Zn(subscript x)TE materials are decorated with tellurium precipitates. Analysis of a tellurium precipitate at a grain boundary by transmission electron microscopy and selected-area electron diffraction found the precipitate to consist of a single, saucer-shaped grain. Electron diffraction from the precipitate was consistent with the trigonal phase of tellurium (space group P3,21), which is the equilibrium phase at room temperature and atmospheric pressure. This precipitate was found to be aligned with one of the adjacent CZT grains such that the tellurium (0111) planes were nearly parallel to the CZT (111) planes. High-resolution transmission electron microscopy of the Te/Cd(subscript 1-x)Zn(subscript x)Te interface showed no tertiary phase at the interface. The structures of the grain boundaries and the Te/Cd(subscript 1-x)Zn(subscript x)Te interface are discussed and related to their possible implications on Cd(subscript 1-x)Zn(subscript x)Te gamma-ray detector performance.
Heffelfinger Jason R.
James Ralph B.
Medlin Douglas L.
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