Stochastic variability in X-ray emission from the black hole binary GRS 1915+105

Details Stochastic variability in X-ray emission from the black hole binary GRS 1915+105 Stochastic variability in X-ray emission from the black hole binary GRS 1915+105

2012-04-17

arxiv.org/abs/1204.3690v1

Astronomy and Astrophysics

Astrophysics

Instrumentation and Methods for Astrophysics

25 pages, 3 figures, 2 tables; to be published in "The Astronomical Journal"

Scientific paper

We examine stochastic variability in the dynamics of X-ray emission from the black hole system GRS 1915+105, a strongly variable microquasar commonly used for studying relativistic jets and the physics of black hole accretion. The analysis of sample observations for 13 different states in both soft (low) and hard (high) energy bands is performed by flicker-noise spectroscopy (FNS), a phenomenological time series analysis method operating on structure functions and power spectrum estimates. We find the values of FNS parameters, including the Hurst exponent, flicker-noise parameter, and characteristic time scales, for each observation based on multiple 2,500-second continuous data segments. We identify four modes of stochastic variability driven by dissipative processes that may be related to viscosity fluctuations in the accretion disk around the black hole: random (RN), power-law (1F), one-scale (1S), and two-scale (2S). The variability modes are generally the same in soft and hard energy bands of the same observation. We discuss the potential for future FNS studies of accreting black holes.

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