STIS CCD CTI Check: STIS Activity Number STIS-14

Computer Science – Performance

Scientific paper

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Scientific paper

For CCD detectors, the transfer of charge from one pixel to the next is not perfect. Charge Transfer Inefficiency {CTI} measurements quantify the fraction of charge left behind after this charge transfer. The further the charge needs to be shifted before the read-out, the more charge it will lose. Therefore, CTI measurements are necessary and can be determined through the "internal sparse field test". CTI measurements are made along the parallel axis and used in conjunction with the following optional parameter POS which allows the off-center positioning of the MSM for some slits. This activity is the first in a series of measurements that will be made to characterize the dependence of the CCD CTI as a function of signal level, source position, and time. The remaining measurements will be conducted as part of the Cycle 17 calibration program to fully characterize the CTI. This activity, executed during the SMOV4 period, will enable measurement of the magnitude of the CTI for a limited parameter set and will provide a comparison of the current CTI performance with the CTI performance prior to the Side-2 failure. All exposures are internals.;

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