Stigmatic high-resolution high-throughput XUV spectroscopic instruments employing unconventional optical components

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We have implemented a variety of stigmatic high-throughput high-resolution spectroscopic configurations in the XUV using focusing multilayer mirrors (MMs), transmission gratings (TGs), and conventional plane reflection gratings. A Type-I 1-m-long spectrograph, which comprises a couple of identical MMs with reflection peaks centered at 180 angstrom and a 1800 line/mm blazed grating operating in the second outside spectral order, has a residual astigmatism of 16 microns, a plate scale of 0.35 Angstrom/mm, a bandwidth of approximately 15 angstrom (FWHM), and a resolution of 24,000 (demonstrated). The solid angle of acceptance is a square which measures 0.03 rad multiplied by 0.015 rad. A density-dependent Stark shift of the 2p43s levels of Mg IV was observed in a laser plasma. A Type-II highly versatile spectrometer, which comprises one focusing MM and a TG used to disperse a converging beam, offers a high throughput and a moderate dispersion, with a plate scale typically in the range 5 - 50 angstrom/mm. With respect to these applications, a number of Mo-Si MMs were synthesized on fused silica substrates (r equals 2000 mm, D equals 60 mm). In combination with a point-like laser-plasma broadband radiation source, the Type-II configuration is by itself inherently suited for spectroscopic characterization of imaging MMs. Our capacity to evaluate the spectral response of MMs has improved dramatically after invoking a 5-cm2-aperture TG with a density of about 1000 lines/mm initially intended for x-ray astronomy. Stigmatic line spectra in a range of 165 - 185 angstrom were obtained in the Type-II configuration, and a resolution of 500 was demonstrated.

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