Stark widths of faint Si II lines

Details Stark widths of faint Si II lines Stark widths of faint Si II lines

May 2004

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2004a%26a...418..765l&link_type=abstract

Astronomy and Astrophysics, v.418, p.765-769 (2004)

Astronomy and Astrophysics

Astrophysics

2

Atomic Data, Line: Profiles, Plasmas, Stars: Atmospheres

Scientific paper

Line profiles of faint Si II lines of astrophysical interest are observed in a conventional shock tube. Electron density is 1.3× 1023 m-3, and the temperature is 11 000 K. The Stark effect is the dominant broadening mechanism. The Si II line at λ 419.07 nm (multiplet 7.26, Moore \cite{Moore65}) Stark width is measured and compared with theoretical prediction.

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