Spitzer Extragalactic First Look Survey Multi-Band Photometry

Astronomy and Astrophysics – Astronomy

Scientific paper

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Scientific paper

The Spitzer Extragalactic First Look Survey (XFLS) covers 4 square degrees of IRAC (3.6, 4.5, 5.8, and 8 microns) and MIPS (24, 70, and 160 microns) imaging. The large area of this survey and the unprecedented sensitivity of Spitzer at mid-IR wavelengths means that statistically significant samples can be obtained to study redshift evolution over more than half the age of the Universe. A key component of such studies is obtaining accurate redshifts for the thousands of galaxies detected. As it is impractical to obtain spectroscopic redshifts for a sample this large, photometric redshift techniques must be used. For this purpose, as well as to learn more about the individual objects in the survey, the XFLS team at the Spitzer Science Center have gathered a substantial ancillary data set. We obtained imaging from optical to radio wavelengths (ugRizJK and 20cm) and optical spectra of a few thousand galaxies. We report here on the catalogs from these data sets as well as some of the challenges of comparing photometry across such a wide wavelength range and using these SEDs for photometric redshifts.

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