Spectral characterization of igneous rocks in the 8- to 12-micron region

Details Spectral characterization of igneous rocks in the 8- to 12-micron region Spectral characterization of igneous rocks in the 8- to 12-micron region

Jul 1989

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1989jgr....94.9203w&link_type=abstract

Journal of Geophysical Research (ISSN 0148-0227), vol. 94, July 10, 1989, p. 9203-9213.

Mathematics

Logic

40

Igneous Rocks, Infrared Spectroscopy, Lithology, Remote Sensing, Spectral Reflectance, Infrared Interferometers, Planetary Composition, Planetary Surfaces, Satellite Observation, Spatial Resolution

Scientific paper

This paper investigates the crystal-chemistry basis for the variation in spectral behavior of ingneous rocks, with the purpose of developing relationships useful for applications in the lithologic characterization of terrestrial and extraterrestrial surfaces. A new parameter is proposed for characterizing general rock and mineral type. The parameter, SCFM, defined as the ratio SiO2/(SiO2 + CaO + FeO + MgO), reflects the degree of depolymerization of the silica tetrahedra in both fine-grained and coarse-grained igneous rocks, and is a good descriptor of the composition of these rocks. Using spectra obtained in the laboratory on coarse-particulate mineral and solid-rock samples, the SCFM parameter was used to assess the effects of variations in the rock composition on the location, number, and width of spectral bands. A regression analysis of bands varying in width from 0.2 micron to 1.4 microns versus the SCFM value resulted in correlation coefficients ranging from 0.88 to 0.97.

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