Space Environment Sensors on the Jem Exposed Facility

Details Space Environment Sensors on the Jem Exposed Facility Space Environment Sensors on the Jem Exposed Facility

Jan 2002

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2002iaf..confe.571g&link_type=abstract

IAF abstracts, 34th COSPAR Scientific Assembly, The Second World Space Congress, held 10-19 October, 2002 in Houston, TX, USA.,

Computer Science

Performance

Scientific paper

We will report on the objectives and performance characteristics of two sensors developed under NASDA sponsorship to measure aspects of the space environment encountered by the International Space Station. The first Standard DOse Monitor (SDOM) monitors the energetic particle environment. It is a compact spectrometer that simultaneously discriminates and analyzes the energy of electrons, protons, alpha and heavy ion particles. The unique characteristics it provides include a large geometric acceptance angle, a wide range of resolvable energies and the discrimination process algorithm. The specific deposited energy signal in each of several detector is used to make this determination. We will describe the SDOM development and ground calibration performance. The second sensor, Atomic Oxygen Monitor (AOM) will measure the integrated flux at the surface of the module. We rely upon an actinometric method for AO determination: erosion of carbon strips exposed to the space environment induces increased resistance to a calibrated current source. We employ a ratiometric approach to provide accurate determination of the total AO fluence encountered. We will present details of the design and calibration process using an 8km/s AO simulation facility at PSI. Both these sensors have completed fabrication and testing, have been calibrated, and delivered to NASDA. They are awaiting further ground processing in preparation for transport to the Exposed Facility on the Japanese Experiment Module on ISS. We will discuss their planned positions for these sensors on the EF and the planned mission operations concept.

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