Solar EUV emission line profiles of SI II and SI III and their center to limb variations

Details Solar EUV emission line profiles of SI II and SI III and their center to limb variations Solar EUV emission line profiles of SI II and SI III and their center to limb variations

Dec 1977

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1977soph...55..305n&link_type=abstract

Solar Physics, vol. 55, Dec. 1977, p. 305-319.

Astronomy and Astrophysics

Astronomy

33

Apollo Telescope Mount, Far Ultraviolet Radiation, Line Shape, Silicon, Solar Limb, Solar Spectra, Atomic Spectra, Chromosphere, Optical Thickness, Plasma Spectra, Skylab Program, Spaceborne Astronomy, Spectral Line Width, Spectroheliographs

Scientific paper

Spectral-line profiles of Si II and Si III are presented which were observed both at solar center and near the quiet solar limb with the EUV spectrograph of ATM/Skylab. Absolute intensities and line profiles are derived from the photographic data. A brief discussion is given of their center-to-limb variations and of the optical thickness of the chromosphere in these lines. Nonthermal broadening velocities are found for the optically thin lines from their full width at half-maximum intensity (FWHM).

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