Silicon chemistry and inferred water vapor in the lower ionosphere

Details Silicon chemistry and inferred water vapor in the lower ionosphere Silicon chemistry and inferred water vapor in the lower ionosphere

Jun 1983

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1983esasp.183..465r&link_type=abstract

In ESA Sixth ESA Symp. on European Rocket and Balloon Programs and Related Res. p 465-472 (SEE N83-33397 21-46)

Computer Science

Sound

Atmospheric Chemistry, Atmospheric Moisture, Ionospheric Composition, Ions, Silicon, Water Vapor, Chemical Reactions, Ionospheric Ion Density, Mass Spectroscopy, Rocket Sounding, Silicon Oxides

Scientific paper

A chemical reaction model for neutral and ionic silicon species was applied to in-situ ion mass spectrometer measurements of five rocket flights. Theoretical profiles of the distribution of Si, Si+, SiO, SiO+, SiO2, SiO+2 and HSiO+, fractional ionization and total silicon densities are obtained. Inferred water vapor mixing ratios from HSiO+ (mass 45) and Si+ (mass 28) measurements in the altitude range between 85 and 120 km are discussed. Results suggest that measured 45+/28+ ratios can be used to infer water vapor densities below 115 km. Above this altitude too high concentrations can result due to outgassing of the rocket and payload, and because ions other than HSiO+ may contribute to mass 45.

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