Statistics – Applications
Scientific paper
Feb 2002
adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2002spie.4493..277z&link_type=abstract
Proc. SPIE Vol. 4493, p. 277-284, High-Resolution Wavefront Control: Methods, Devices, and Applications III, John D. Gonglewski;
Statistics
Applications
1
Scientific paper
Shack-Hartmann wave-front sensor (SHWS) was designed to measure both intensity distribution and phase distortion of optical fields in real time and high accuracy. It can be widely used not only in measuring, diagnostic, but also in adaptive optical systems to compensate for phase distortions. Various parameters such as peak-to-valley, root-mean square, Zernike coefficients, beam quality (M2) could be calculated with the help of such a sensor. The results of wavefront measurements by using our SHWS are reported in this paper.
Kudryashov Alexis V.
Zavalova Valentina Y.
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