Semiconductor laser linewidth measurements for space interferometry applications

Details Semiconductor laser linewidth measurements for space interferometry applications Semiconductor laser linewidth measurements for space interferometry applications

Apr 1999

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1999spie.3626..115d&link_type=abstract

Proc. SPIE Vol. 3626, p. 115-122, Testing, Packaging, Reliability, and Applications of Semiconductor Lasers IV, Mahmoud Fallahi;

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Narrow linewidth (< 100 KHz) semiconductor lasers are expected to be a key technology in NASA's stellar interferometry missions to search for planets around nearby stars. Long coherence length lasers are needed for precise (20 pm to 5 nm) measurements of the optical path difference. This work discusses results using the self-heterodyne delay technique to measure 1.3 um InP based DFB lasers. We will also address practical issues concerning detection and elimination of back reflections, choice of fiber length and resolution, and measurement of laser l/f and current supply noise.

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