Scanning Scattering Near-Field Infrared Microscopy: A New Tool for the Mapping of Functional Groups at the Ten Nanometer Scale

Details Scanning Scattering Near-Field Infrared Microscopy: A New Tool for the Mapping of Functional Groups at the Ten Nanometer Scale Scanning Scattering Near-Field Infrared Microscopy: A New Tool for the Mapping of Functional Groups at the Ten Nanometer Scale

Mar 2010

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2010lpi....41.2265a&link_type=abstract

41st Lunar and Planetary Science Conference, held March 1-5, 2010 in The Woodlands, Texas. LPI Contribution No. 1533, p.2265

Computer Science

Scientific paper

A novel infrared spectral mapping instrument has been developed offering
the ability characterize the functional group composition of returned
samples with ten nanometer spatial resolutions with minimal or no sample
alteration.

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