Retroreflector diffraction modeling

Details Retroreflector diffraction modeling Retroreflector diffraction modeling

Jul 1998

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1998spie.3350..109l&link_type=abstract

Proc. SPIE Vol. 3350, p. 109-115, Astronomical Interferometry, Robert D. Reasenberg; Ed.

Astronomy and Astrophysics

Astronomy

Scientific paper

The SIM metrology subsystem utilizes cornercube retroreflectors as fiducials. These components will introduce errors in the metrology output that must be quantified. Eventually, a complete modeling of the metrology subsystem will be needed. For that purpose, we are developing an optical model for a cornercube retroreflector, taking into account most of the defects present in such an optical part. Our goal is to given a phase map of the wavefront produced by the interference of the reference beam and the metrology beam. Our first step towards this goal is the construction of an optical model and its validation, using the MACOS and VSIM packages.

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