Mathematics – Logic
Scientific paper
Oct 2005
adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2005spie.5964..112r&link_type=abstract
Advances in Optical Thin Films II. Edited by Amra, Claude; Kaiser, Norbert; Macleod, H. Angus. Proceedings of the SPIE, Volume
Mathematics
Logic
Scientific paper
The evaluation of technological parameters is of primary importance for the detector industry, since it allows both to validate the fabrication process and to optimize the electro-optical characteristics of the detectors. By measuring the spectral response of detectors with a high resolution, it is possible to display specific optical effects. Using a radiometric model of the detecting architecture, we are able to understand their physical origins and to determinate some technological and optical parameters. We have developed a test bench which provides spectral responses of infrared detectors using a Fourier transform spectrometer. The principle of the test bench and the methodology used are detailed. Experimental results, as well as the associated radiometric model, are presented for a dedicated 320×240 MCT LWIR focal plane arrays (FPAs).
Chamonal Jean-Paul
de Borniol Eric
Deschamps Jo"l.
Destefanis Gérard
Guérineau Nicolas
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