Reseau astrometry with Palomar Schmidt plates - A two-way analysis of variance

Details Reseau astrometry with Palomar Schmidt plates - A two-way analysis of variance Reseau astrometry with Palomar Schmidt plates - A two-way analysis of variance

Oct 1981

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1981pasp...93..655w&link_type=abstract

Astronomical Society of the Pacific, Publications, vol. 93, Oct.-Nov. 1981, p. 655-657.

Astronomy and Astrophysics

Astronomy

3

Analysis Of Variance, Astrometry, Photographic Plates, Schmidt Telescopes, Stars, Astronomical Catalogs, Coordinate Transformations, Position Errors

Scientific paper

It is shown that reseau astrometry can provide positional accuracy on the order of an arc second over the full area of a Palomar-Schmidt field. A formal two-way analysis of variance is performed to test differences between positions generated using the coordinate transformation formulas of Dixon (1963) and Smart (1977), and the positional standards selected from the AGK3 and SAO star catalogs. The formal F-test shows no significant differences at the 95% confidence levels, although errors derived from the AGK3 catalog are systematically smaller than those from the SAO.

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