Reliability of integrated circuits modified by focused ion beam for space applications

Details Reliability of integrated circuits modified by focused ion beam for space applications Reliability of integrated circuits modified by focused ion beam for space applications

Dec 2002

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2002esasp.507...53d&link_type=abstract

Proceedings of the European Space Components Conference, ESCCON 2002, 24-27 September 2002, Toulouse, France. Compiled by R.A. H

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Focused Ion Beam (FIB) is routinely used to modify integrated circuits.
But, can we use it directly in our space applications? Can we guarantee
that the device will still work properly months or years later?

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