Reflectance standards at ultraviolet wavelengths

Details Reflectance standards at ultraviolet wavelengths Reflectance standards at ultraviolet wavelengths

Sep 1999

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1999spie.3818....9b&link_type=abstract

Proc. SPIE Vol. 3818, p. 9-14, Ultraviolet Atmospheric and Space Remote Sensing: Methods and Instrumentation II, George R. Carru

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Polytetrafluoroethylene (PTFE) is widely used in remote sensing applications requiring a diffuse reflectance standard for detector calibration. The bi-directional and directional-hemispherical reflectance properties of both pressed and sintered PTFE were measured at ultraviolet wavelengths to provide information for their use as standards in this spectral range. The reflectance decreases with decreasing wavelength for both geometries, and the ratio between the reflectances for these geometries remains constant for wavelengths from 300 nm to 400 nm.

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