Redistribution of radiation by the fluctuating ion microfield.

Details Redistribution of radiation by the fluctuating ion microfield. Redistribution of radiation by the fluctuating ion microfield.

Oct 1989

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1989jqsrt..42..327r&link_type=abstract

Journal of Quantitative Spectroscopy and Radiative Transfer, vol. 42, issue 4, pp. 327-336

Computer Science

2

Line Profiles: Deuterium, Line Profiles: Stark Broadening

Scientific paper

The redistribution of populations due to electric field fluctuations within a Stark-broadened profile of the deuterium line D6 can be approximately described by master equations. The high-frequency component of the microfield (electrons) is included by using Lorentz-broadened Stark components. The dynamics of the low-frequency component (ions) are characterized by average lifetimes of the microfield strength. The interaction with short laser pulses deforms the microfield distribution (hole burning) in a manner that is analogous to the case of Doppler broadening. In order to obtain a simple survey concerning redistribution, a rate equation system is numerically solved by using time-iterative calculations.

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