Radiation-induced transmission loss of integrated optic waveguide devices

Details Radiation-induced transmission loss of integrated optic waveguide devices Radiation-induced transmission loss of integrated optic waveguide devices

Apr 1993

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=1993spie.1794...79h&link_type=abstract

Proc. SPIE Vol. 1794, p. 79-90, Integrated Optical Circuits II, Ka-Kha Wong; Ed.

Computer Science

Scientific paper

The radiation sensitivity of different integrated optic (IO) devices was compared under standardized test conditions. We investigated four relatively simple device types made by four different manufacturers. The waveguide materials were proton exchanged LiTaO3, LiNbO3:Ti, Tl-diffused glass, and Ag-diffused glass, respectively. In order to standardize the irradiation parameters we followed the 'Procedure for Measuring Radiation-Induced Attenuation in Optical Fibers and Optical Cables' proposed by the NATO NETG as close as possible. In detail we made pulsed irradiations with dose values of about 500 rad*, 104 rad, and 105 rad, as well as continuous irradiations at a 60Co source with a dose rate of 1300 rad*/min up to a total dose of 104 rad. Device temperatures were about 22 degree(s)C, -50 degree(s)C, and +80 degree(s)C.

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