Radiation damage studies of XAA1.2 ASIC chip for the SuperAGILE experiment onboard AGILE

Details Radiation damage studies of XAA1.2 ASIC chip for the SuperAGILE experiment onboard AGILE Radiation damage studies of XAA1.2 ASIC chip for the SuperAGILE experiment onboard AGILE

Mar 2003

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2003spie.4851.1029d&link_type=abstract

X-Ray and Gamma-Ray Telescopes and Instruments for Astronomy. Edited by Joachim E. Truemper, Harvey D. Tananbaum. Proceedings

Astronomy and Astrophysics

Astronomy

Scientific paper

SuperAGILE is the X-ray instrument of the AGILE Mission. It is a set of silicon micro-strip detectors tiles coupled with a tungsten coded mask. The front end electronics of SuperAGILE is based on 48 ASIC XAA1.2 chips, each one collecting and conditioning the signals from 128 strips of the detector. Since this chip was not developed as a radiation resistant component for space applications and in order to predict and prevent the potential problems deriving from the space radiation environment, we irradiated two of such chips with ions of different chemical specie, ranging from 16O to 127I. At the 15 MV Tandem accelerator of the Laboratori Nazionali INFN di Legnaro we measured the occurrence of latch-up and Single Event Upset and the effects due to the absorbed total dose on the supply currents and on the bias currents which control the performances of the chip. In this paper we discuss how the results can be scaled to the AGILE environment and the impact of these data on the experiment design and on the observing strategy.

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