Quantitative Mineralogical Analysis of Mars Analogues Using CHEMIN Data and Rietveld Refinement

Details Quantitative Mineralogical Analysis of Mars Analogues Using CHEMIN Data and Rietveld Refinement Quantitative Mineralogical Analysis of Mars Analogues Using CHEMIN Data and Rietveld Refinement

Mar 2004

adsabs.harvard.edu/cgi-bin/nph-data_query?bibcode=2004lpi....35.1404b&link_type=abstract

35th Lunar and Planetary Science Conference, March 15-19, 2004, League City, Texas, abstract no.1404

Mathematics

Logic

1

Scientific paper

The third generation CHEMIN XRD/XRF instrument produces well-resolved
diffraction data that can be used to great advantage with Rietveld
refinement methods as a critical component of mineralogical analysis in
planetary surface exploration.

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