Proton damage effects in EEV charge coupled devices

Astronomy and Astrophysics – Astronomy

Scientific paper

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Charge Coupled Devices, Proton Irradiation, Radiation Damage, Satellite-Borne Instruments, Spaceborne Astronomy, X Ray Spectroscopy, Astronomical Spectroscopy, Earth Orbital Environments, Radiation Dosage

Scientific paper

An examination is conducted of the effects of low-energy protons on CCD performance to evaluate the potential effectiveness of space-borne observational instruments. Degradation is described as a function of incremental dose, irradiation temperature, or proton energy for several device architectures, some of which incorporate design features to minimize signal-charge/trapping-site interaction. Degradation of the charge transfer is studied for very low proton doses, and dark current is found to vary directly with proton dose. Displacement damage in the signal-transfer channels generates charge-trapping sites that have a negative effect on EEV CCD performance. Degradation of charge-transfer performance is shown to be the most significant hindrance to effective CCD operations for X-ray spectroscopic applications.

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